{"id":22,"date":"2020-09-29T11:17:37","date_gmt":"2020-09-29T02:17:37","guid":{"rendered":"http:\/\/www.tmele.jp\/en2020\/?page_id=22"},"modified":"2021-01-09T18:07:26","modified_gmt":"2021-01-09T09:07:26","slug":"facility","status":"publish","type":"page","link":"https:\/\/www.tmele.jp\/en2020\/facility\/","title":{"rendered":"Production Facility"},"content":{"rendered":"<br \/>\n<section id=\"intro\">\n<div class=\"inner\">\n<h2 class=\"underbar-short-center\">Production Facility<\/h2>\n<div class=\"inside fields flexs nowrap justify\">\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph01.jpg\" alt=\"Production Facility\"><figcaption>Designing Substrate<\/figcaption><\/figure>\n<div>\n<p>We have high-frequency measurement equipment necessary for high-precision performance inspection and evaluation, and we have a wide range of frequency bands ranging from DC to 50 GHz.Impedance can be used for both 50\u03a9 and 75\u03a9.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"inside fields flexs nowrap justify\">\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph02.jpg\" alt=\"Production Facility\"><figcaption>Spatter<\/figcaption><\/figure>\n<div>\n<p>Our optical signal analysis equipment supports the inspection and evaluation of optical products. <br \/>\nSince we have a large number of these facilities, we meet all production conditions, from mass production to small-volume production.<\/p>\n<\/p><\/div>\n<\/p><\/div>\n<div class=\"inside fields flexs nowrap justify\">\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph07.jpg\" alt=\"Cleanroom\"><figcaption>Cleanroom<\/figcaption><\/figure>\n<div>\n\t\t\t\t\t<!--p>\u8fd1\u5e74\u306e\u5468\u6ce2\u6570\u9ad8\u57df\u5316\u306b\u4f34\u3044\u3001\u5f53\u793e\u3067\u306f\u30df\u30ea\u6ce2\u306e\u88fd\u9020\u8a2d\u5099\u3092\u5c0e\u5165\u3057\u3066\u304a\u308a\u307e\u3059\u3002\u534a\u5c0e\u4f53\u5b9f\u88c5\u306b\u306f\u9ad8\u3044\u6e05\u6d44\u5ea6\u304c\u6b20\u304b\u305b\u307e\u305b\u3093\u3002\u5f53\u793e\u3067\u306fISO\u6700\u9ad8\u6e05\u6d44\u5ea6\u30ec\u30d9\u30ebCLASS-1\u306e\u30af\u30ea\u30fc\u30f3\u30eb\u30fc\u30e0\u3092\u4fdd\u6709\u3002\u307e\u305f\u3001\u30ef\u30e4\u30dc\u30f3\u30c0\u3001\u30c0\u30a4\u30dc\u30f3\u30c0\u3082\u6240\u6709\u3057\u3066\u304a\u308a\u307e\u3059\u306e\u3067\u3001\u30d9\u30a2\u30c1\u30c3\u30d7\u54c1\u306e\u6700\u9ad8\u6027\u80fd\u3092\u5f15\u304d\u51fa\u3059\u305f\u3081\u306b\u30df\u30af\u30ed\u30f3\u5358\u4f4d\u3067\u306e\u30ef\u30a4\u30e4\u9577\u7ba1\u7406\u3001\u7cbe\u5bc6\u306a\u30c1\u30c3\u30d7\u5b9f\u88c5\u3092\u793e\u5185\u3067\u88fd\u4f5c\u3059\u308b\u3053\u3068\u304c\u3067\u304d\u307e\u3059\u3002<\/p-->\n\t\t\t\t<\/div>\n<\/p><\/div>\n<div class=\"inside\">\n<ul>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph03.jpg\" alt=\"X-ray fluorescence analyzer\"><figcaption>X-ray fluorescence analyzer<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph04.jpg\" alt=\"Machining Center\"><figcaption>Machining Center<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph05.jpg\" alt=\"Oscilloscope\"><figcaption>Oscilloscope<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph06.jpg\" alt=\"Network Analyzer\"><figcaption>Network Analyzer<\/figcaption><\/figure>\n<\/li>\n<\/ul>\n<ul>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph08.jpg\" alt=\"Wire Bonder \/ Die Bonder\"><figcaption>Wire Bonder \/ Die Bonder<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph09.jpg\" alt=\"3D Scanner Type Coordinate Measuring Machine\"><figcaption>3D Scanner Type Coordinate Measuring Machine<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph10.jpg\" alt=\"Microscope\"><figcaption>Microscope<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph11.jpg\" alt=\"Image Dimension Measuring Instrument\"><figcaption>Image Dimension Measuring Instrument<\/figcaption><\/figure>\n<\/li>\n<\/ul>\n<ul>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph12.jpg\" alt=\"Vibration Tester\"><figcaption>Vibration Tester<\/figcaption><\/figure>\n<\/li>\n<li>\n<figure><img decoding=\"async\" src=\"https:\/\/www.tmele.jp\/en2020\/wp-content\/themes\/tamagawadenshi\/images\/facility\/ph13.jpg\" alt=\"Thermal Shock Tester\"><figcaption>Thermal Shock Tester<\/figcaption><\/figure>\n<\/li>\n<li>&nbsp;<\/li>\n<li>&nbsp;<\/li>\n<\/ul><\/div>\n<\/p><\/div>\n<\/section>\n<p>\t<!--section>\n\t\t\n\n<div class=\"inner\">\n\t\t\t\n\n<h2 class=\"underbar-short-center\">Main Equipments<\/h2>\n\n\n\t\t\t\n\n<div class=\"inside\">\n[table id=1 column_widths=\"50%|25%|25%\" \/]\n\t\t\t<\/div>\n\n\n\t\t<\/div>\n\n\n\t<\/section-->\n<p>\t<!--section>\n\t\t\n\n<div class=\"inner\">\n\t\t\t\n\n<h2 class=\"underbar-short-center\">Performance Evaluation Testing Equipments<\/h2>\n\n\n\t\t\t\n\n<div class=\"inside\">\n[table id=2 column_widths=\"50%|25%|25%\" \/]\n\t\t\t<\/div>\n\n\n\t\t<\/div>\n\n\n\t<\/section-->\n<p>\t<!--section>\n\t\t\n\n<div class=\"inner\">\n\t\t\t\n\n<h2 class=\"underbar-short-center\">Processing Equipment<\/h2>\n\n\n\t\t\t\n\n<div class=\"inside\">\n[table id=3 column_widths=\"50%|25%|25%\" \/]\n\t\t\t<\/div>\n\n\n\t\t<\/div>\n\n\n\t<\/section-->\n","protected":false},"excerpt":{"rendered":"Production Facility Designing Substrate We have high-frequency measurement equipment necessary for high-precis","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":10,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/pages\/22"}],"collection":[{"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/comments?post=22"}],"version-history":[{"count":0,"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/pages\/22\/revisions"}],"wp:attachment":[{"href":"https:\/\/www.tmele.jp\/en2020\/wp-json\/wp\/v2\/media?parent=22"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}