Burn-In Test System for Semiconductor (RF/DC)
We have provided energization-equipment for high-frequency-power-FET (GaAs, GaN) to mager semiconductor manufacturers in Japan for many years.
We customize functions required from customer’s application, such as reliability test for newly developed device or use under production line.
These days, even though device-package-size has been smaller and more complicated, we can design and produce suitable jig (fixture) using our experience of high frequency components as a manufacturer and paying attention to characteristic of high frequency.
We can also offer customize-design and long term maintenance according to customer’s requirement.